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LINbus I/O Module

    LINbus I/O Module

    Manufacturer: IHR Automotive

    Call for pricing or request a quote.


    • Description

    LIN I/O is the communication adapter between production automation and the LIN test object.

    This device variation has been conceived for fixed installation on a rail or in a switch cabinet. LIN I/O is the communication adapter between production automation and the LIN test object. The connection to the automatic testing device or SPS is effected optionally via high-speed CAN and/or 24V digital I/O - in both cases potentially separated from the LIN test object. The test object can be fed in a short-circuit protected manner via the LIN I/O. As a unique particularity, the current uptake of the test object is measured and can be used in the evaluation.

    The internal signal processing makes it possible to pre-process the LIN data, for example for checking the limiting values or plausibility, or for the end-of-line calibration of the control devices. The SPS can thus be freed up and the LIN interface can independently carry out simple sequences and deliver - for example - "good/bad" evaluations to the SPS.

    In spite of the deviation in hardware appearance, the LIN I/O is compatible with the other members of the family of tools.

    Performance Characteristics of LIN I/O:

    • Emulation and Analysis of LIN nodes / LIN subsystems, simulation of bus participants not actually present
    • Wakeup / Sleep
    • Event-based signal configuration and sequence control
    • LIN bus error recognition, playback via CAN, LED and port possible
    • PC program Visulin for recording and displaying measurement data, and also for configuring the emulator
    • Simple integration into automated test environments (LabView, HP VEE, and others)


    • Status display via LED's
    • Ohmic bus termination (master/slave/stress/overload) switchable by means of software
    • galvanically separated digital inputs/outputs (like digital I/O module)
    • LED status display for digital ports
    • 4 analog inputs
    • 2 analog outputs, trigger creation
    • 1 current measurement channel for current uptake of the test object
    • Housing for the top hat rail assembly, 200 x 105 mm
    • Connections designed as plugable rows of pins

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