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ByteParadigm's specialized Digital Pattern Generators and Loggers are designed to dramatically reduce the time it takes to test and debug embedded systems and IC designs. They are made to save engineers time and cost, and transform designers into “development cycle heroes”. By making it faster and easier to create stimulus-and-response (input/output result) test sequences, they accelerate debug tasks, shorten product design cycles, simulate missing/new hardware, analyze and stress serial protocols, and verify system responses. ByteParadigm's Digital Pattern Generators, SPI Adapters, and byte-wide Loggers are in use worldwide by engineers at leading-edge electronics firms such as Intel, HP, TI, Qualcomm, and many others. Byte Paradigm’s personal customer service is appreciated by them too! Many of the features built into Byte Paradigm tools have been at costumer request. Please scroll to the bottom of this page for links to Application Notes, White Papers, and product information from the ByteParadigm website.
Application Notes Tools and methodologies for a better observability Finding the right mix of solutions for the right mix of engineers Solutions for SPI protocol testing and debugging in ebedded systems SPI protocol master / analyzer on USB
White Papers Digital Pattern Generator - An essential tool for digital system development (615 kb) Engineers increasingly vote for prototyping for embedded system debug (311 kb) What is LOG Storm and what is it useful for? Oscilloscopes vs. Logic Analyzers
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