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GW Instek GOM-805 DC Milliohm Meter

    GW Instek GOM-805 DC Milliohm Meter

    Manufacturer: GW Instek

    Price: $1,040.00


    • Description
    • Features
    • Specifications
    • Downloads

    GW Instek’s GOM-805 D.C. milliohm meter features a 3.5-inch TFT display, a 50,000 count display, and a rapid sampling rate of 60 readings per second.  Similar to the GOM-804, the GOM-805 also includes various drive modes and Dry Circuit operation for contact resistance measurement applications. This high accuracy instrument offers a measurement precision of 0.05%, with four-wire measurement capability as well as temperature measurement for temperature-compensated measurements to meet the requirements of low-resistance applications with a minimum full-scale range of 50mOhm and a resolution of 1uOhm. Additional features, such as 20 panel setting memory locations and versatile control interfaces (RS-232C, USB, Handler/Scan/EXT IO or optional GPIB), make the GOM-805 milliohm meter a convenient, practical tool.  The EXT IO allows for connecting to a sorting machine, an external on-off switch, or an external trigger control.  Independent function and direction keys increase the operator convenience and intuitive operation of the GOM-805.

    The GOM-805 has additional drive mode capabilities than the GOM-804. Dry Circuit and various drive modes (DC+, DC-, Pulsed, PWM) allow for milliohm measurements on different materials. The pulsed current output mode is useful when working with conductors of different materials by reducing the temperature-generated electric potential of different conductors when conducting low resistance measurements. The DC+ and DC- output modes are best for the measurement requirements of inductive components. The PWM output mode is ideal for temperature sensitive materials, and can help to avoid resistance variation due to measurements over a long period of time. Dry circuit can limit the applied voltage under the open circuit voltage of 20mV to avoid over voltage which can damage oxide coatings and change measurements.

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