With Micsigs exclusive SigOFIT optical isolation technology, the SigOFIT series probe can be powered by laser, delivers extremely high CMRR and isolation voltage, help engineers to see the whole truth of the signal within its bandwidth.
Present True Signal
SigOFIT series probe has highest common mode rejection ratio, or CMRR, up to 112dB at 100MHz, over 100dB at 500MHz. It is the ultimate referee of signal fidelity measured by other voltage probes.
Highest Accuracy
The SigOFIT probe has excellent amplitude-frequency characteristics, effective accuracy bandwidth [1] is as high as more than 50% of the nominal bandwidth. Within the effective accuracy bandwidth, the test accuracy of 1.5% can be guaranteed, and the DC gain accuracy is better than 1%. The maximum noise floor within the range is 1.41mVrms, and zero drift is less than 500u V after warm-up.
Best Probe for Third-Gen Semiconductor
SiC GaN device can switch high voltages in a few nanoseconds, the signal may have high-energy high-frequency harmonics.
Even at the highest bandwidth, the SigOFIT probes still have nearly 100dB CMRR, perfectly suppressed the oscillation caused by high-frequency common-mode noise, no redundant components. It is the best choice for 3rd-gen semiconductor test & measurement.
Safe to Test GaN
The test leads of SigOFIT probes are short and with coaxial cable transmission, has less than 3pF input capacitance, very safe to test GaN.
* When the working parameters of the device are already in the critical state of explosive, there will be nearly 3pF more capacitance added when connected to the DUT, safety hence is not guaranteed.
Compact & Simple
Smaller size than traditional differential probes, has more accurate probe tips, makes it much more easier and flexible to use.
Wide Measurement Range
Unlike traditional differential probes can only test high-voltage signals, SigOFIT probes can be used with different attenuator tips to test differential mode signals from ±0.01V to ±6250V, achieve full-range output and very high signal-to-noise ratio.
Efficient & Affordable
Fastest response, can be tested immediately after power-on; AutoZero completed in less than 1 second, ensures accurate signal output in real time.
Applications
- Design of motor drive, power converter, electronic ballast
- Design of GaN, SiC, IGBT Half/Full bridge devices
- Design of inverter, UPS and switching power supply
- Safety test for high voltage, high bandwidth applications
- Power device evaluation
- Current shunt measurements
- EMI & ESD troubleshooting
- Floating measurements