Langer EMV-Technik E2 Set TS 23 Immunity Development System

The E2 set is a system of EMC tools for pre-compliance immunity testing of assemblies and electronic devices. It is used for troubleshooting and vulnerability analysis of electronics across all system levels.

A key application is the analysis of electronic designs that have failed EMC immunity compliance tests and require redesign or optimization.

Another important use case is the pre-compliant testing during early development stages. This enables engineers to identify potential weaknesses early and significantly reduce the risk of failing formal EMC compliance tests.

The E2 set allows reproduction of typical failure modes observed in immunity testing, including fast transient disturbances (burst, IEC 61000-4-4) and electrostatic discharge (ESD, IEC 61000-4-2).

It enables engineers to determine both the coupling mechanism (magnetic field or electric field) and the exact location of the interference on the device under test (DUT). Design modifications can be immediately evaluated for effectiveness using the E2 Set.

The test set-up is compact and designed for use directly at the engineer’s workbench.