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Teledyne LeCroy T3AWG3252 250MHz Function Arbitrary Waveform Generator

    Teledyne LeCroy T3AWG3252 250MHz Function Arbitrary Waveform Generator

    Manufacturer: Teledyne LeCroy


    Price: $17,725.00

     

    • Description
    • Features
    • Specifications
    • Downloads

    The T3AWG3252 ia a multifunctional generator that combines many functions in one instrument, including Arbitrary Function Generator, Arbitrary Waveform Generator and Digital Pattern Generator.

    These three-different functionalities are leveraging on the HW flexibility adopting two different technologies.

    An improved Direct Digital Synthesis (DDS) based technology adopted when using the Function Generator (AFG) lets the user to change glitch free on-the-fly all the parameters preserving the waveform shape.

    All control and setting are always one touch away: swipe gesture to change the channel, the carrier selection and have access to the modulation parameters, swipe into the waveform gallery to import a signal at a glance and use the touch-friendly virtual numeric keyboard to change parameters values.

    The variable clock, true-arbitrary technology adopted when using the Arbitrary Waveform / Digital Pattern Generator lets the user to create complex waveforms of analog and digital pattern, insert them is a sequence, apply loops, jumps and conditional branches. Digital output combined and synchronized with analog output signals represents an ideal tool to troubleshoot and validate digital design. The waveform memory length of 128 Mpoints (up to 1 Gpoints optional) on each channel combined with number of waveforms entries up to 16,384 and the waveform repeat count higher then 4 109 or infinite makes the T3AWG3252 the the best-in-class waveform generators for the most demanding technical applications.

    This disruptive and innovative hardware architecture provides the possibility to generate unmatched performances, versatile functionality, outstanding usability, making the T3AWG3252 the ideal generator for today’s and tomorrows test challenges.




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